Journal Indexes Journal Indexes
Saved0
All
By index By subject →

Citation indexes

ScopusQ1–Q4 quartiles, CiteScore Web of ScienceSCIE, SSCI, AHCI, ESCI

Business rankings

ABDCRated A* to C ABS / AJGGraded 4* to 1

Open access

DOAJOpen-access journals

Elite lists

UTD 24UT Dallas research list FT50Financial Times 50

India

ONOSRead and publish free
Article IndexesAuthor Indexes
Journal FinderFind, vet and target the right journalKey Journal IndexesFT50, ABDC, Scopus, WoS and DOAJ explainedPredatory Journal CheckerRed flags, lists and tools before you submitPublication Fees (APC)What Scopus journals charge, free ones firstData ReportsOriginal numbers on fees and Scopus coverageMethodologySources, dates and how journals are matchedIndex ChangesWhat was added to or removed from each index
Sources BlogCommunityAbout Saved0
October 2026 52,299 journals indexed.
Back
Share
Community

Compare journals

    Get an email when this journal's indexing changes

    Added to or removed from Scopus, Web of Science, ABDC, DOAJ, FT50, UT Dallas or ONOS. One confirmation click; unsubscribe anytime.

    Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP

    Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP is Scopus-indexed (Q4, CiteScore 0.1). Published by Institute of Electrical and Electronics Engineers Inc..

    Checked against the index lists dated 4 October 2026.

    ISSN 2768-1874Verify ISSN ↗2836-8487Verify ISSN ↗

    Publisher: Institute of Electrical and Electronics Engineers Inc.

    Scopus · Q4
    0.1
    CiteScore 2025
    Scopus
    Q4
    Best quartile
    rank 174 of 198 · 12th pctile
    1
    Indexed in
    major index

    Cost to publish: No APC data — check the publisher

    ScopusElsevier Scopus
    Status
    Active
    Coverage
    2025
    Source type
    Journal
    Open access
    No
    CiteScore
    0.1
    Best quartile
    Q4 · 12th pctile
    Subject areaRankPctileQ
    Control and Optimization174 / 19812thQ4
    Instrumentation190 / 2068thQ4
    Safety, Risk, Reliability and Quality260 / 2827thQ4
    Electrical and Electronic Engineering983 / 10304thQ4
    Electronic, Optical and Magnetic Materials308 / 3183rdQ4
    View this source on Scopus.com
    DOAJDirectory of Open Access Journals (live)
    Not in DOAJ
    Open accessNot registered as fully open access

    Not listed in: Web of Science, DOAJ, ABDC, ABS / AJG, FT50, UT Dallas, ONOS (subscription), ONOS (APC covered)

    Quick answers

    Is Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP indexed in Scopus?

    Yes — actively indexed in Scopus, coverage 2025, best quartile Q4, CiteScore 0.1.

    What quartile is Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP in Scopus?

    Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP is Q4 in Control and Optimization (rank 174 of 198), Q4 in Instrumentation (rank 190 of 206) and Q4 in Safety, Risk, Reliability and Quality (rank 260 of 282), by CiteScore 2025. It is ranked in 5 subject areas in all.

    What is the impact factor of Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP?

    Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP is not in the Web of Science Core Collection (SCIE, SSCI, AHCI or ESCI), so Clarivate publishes no Journal Impact Factor for it. Its Scopus CiteScore is 0.1, quartile Q4, 12th percentile. Any "impact factor" quoted elsewhere is not the Clarivate metric.

    Who publishes Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP and what is its ISSN?

    Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP is published by Institute of Electrical and Electronics Engineers Inc. Its print ISSN is 2768-1874 and its online ISSN is 2836-8487.

    Is Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP in Web of Science?

    No — it is not currently in the Web of Science core collections (SCIE, SSCI, AHCI or ESCI).

    Is Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP open access?

    No — it is not registered as an open-access journal in DOAJ or Scopus.

    Official sources & links

    Scopus source ↗ ISSN Portal · 2768-1874 ↗ISSN Portal · 2836-8487 ↗

    Community experience: reader comments on this journal

    Comments load as you scroll here.

    Related journals

    8 journals
    Journal Indexed in
    Proceedings. Smart City Symposium Prague, SCSP Scopus Q4 Proceedings - Swiss Conference on Data Science, SDS Scopus Q3 Proceedings the Institute Radio Engineers Not in these indexes Progress in Applied Electrical Engineering, PAEE Scopus Q4 Protection and Control of Modern Power Systems Scopus Q1 WoS SCIE RAICS - IEEE Recent Advances in Intelligent Computational Systems Scopus Q3 Resilience Week, RWS Scopus Q4 RusAutoCon - Proceedings of the International Russian Automation Conference Scopus Q4
    ← Back to Journal Finder

    Index data is curated from public sources (Scopus, Web of Science, ABDC, FT50, UT Dallas, DOAJ). CiteScore and quartiles reflect the latest available Scopus release. Always verify a journal's current status on its official source before submitting.

    Journal Indexes

    Free lookup of 52,000+ academic journals across Scopus, Web of Science, ABDC, ABS / AJG, DOAJ, FT50, UT Dallas 24 and ONOS — check a journal before you submit.

    Research

    Journal Finder Journals by Subject Publishing Toolkit Key Journal Indexes Predatory Journal Checker Publication Fees (APC)

    Monthly Visitors

    ···

      Contact us

      Questions or feedback? Let's talk.

      We read every message — typically replying within 48 hours.

      Send us a message

      Or write to contact@journalindexes.com

      Parent siteYuvijenyuvijen.com

      On Yuvijen

      Learn

      Free Books Blog Data Analytics

      Tools

      Periodic Table Element Reference Distributions P-Value Calculator Sample Size Calculator

      Exam Prep

      Exam Prep Hub UGC NET IPMAT CAT CBSE Class 8

      © 2026 Journal Indexes, a Yuvijen project. All rights reserved. · About Journal Indexes · Methodology · Reports · Community · Terms · Privacy