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Advanced Structural and Chemical Imaging

Advanced Structural and Chemical Imaging is not currently indexed in Scopus. Published by SpringerOpen.

ISSN 2198-0926Verify ISSN ↗

Publisher: SpringerOpen

Scopus · Inactive
0
Indexed in
major indexes

Cost to publish: About US$1,290 to publish open access (publisher list price, via OpenAlex) — subscription publishing may be free

Web of ScienceClarivate (SCIE/SSCI/AHCI/ESCI)
Not listed in Web of Science.
ABDCAustralian Business Deans Council 2025
Not listed in ABDC.
DOAJDirectory of Open Access Journals (live)
Not in DOAJ
Open accessNot registered as fully open access
FT50Financial Times research list
Not listed in FT50.
UT DallasUTD top-100 business research
Not listed in UT Dallas.
ONOS · APC coveredOne Nation One Subscription (Govt of India)
Not in the ONOS APC-supported list.
Publishing in this journal is not centrally APC-funded under One Nation One Subscription.

Is Advanced Structural and Chemical Imaging indexed in Scopus? No — it was previously covered by Scopus but its coverage is now inactive/discontinued (2015–2020).

What is the impact factor of Advanced Structural and Chemical Imaging? Advanced Structural and Chemical Imaging has no Journal Impact Factor — JIF is published only for Web of Science SCIE and SSCI titles — and Scopus has not published a current CiteScore for it either. Treat any "impact factor" quoted for this journal elsewhere as unofficial.

Is Advanced Structural and Chemical Imaging in Web of Science? No — it is not currently in the Web of Science core collections (SCIE, SSCI, AHCI or ESCI).

Is Advanced Structural and Chemical Imaging open access? No — it is not registered as an open-access journal in DOAJ or Scopus.

Impact & reach — open metrics via OpenAlex

29
h-index
0
2-yr mean citations
58
i10-index
72
works indexed
3,097
total citations
Papers published per year
010202015: 16 papers1620152016: 19 papers1920162017: 16 papers1620172018: 13 papers1320182019: 5 papers520192020: 3 papers32020

Advanced Structural and Chemical Imaging published 3 papers in 2020; its busiest recent year was 2016 with 19. 2026* is the year so far.

Main topics
Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced X-ray Imaging TechniquesIntegrated Circuits and Semiconductor Failure Analysis

h-index, i10-index and 2-year mean citedness are open, licence-clear metrics from OpenAlex — not a proprietary impact factor. Updated 2026-09-24.

Integrity signals — indicators, not proof of misconduct

  • Scopus statusInactive — coverage ended 2020
  • Retracted papers None recorded

Retractions and authorship from OpenAlex; Scopus status from the Scopus source list. A signal marks something to look at more closely; it is not a finding against the journal.

Official sources & links

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Index data is curated from public sources (Scopus, Web of Science, ABDC, FT50, UT Dallas, DOAJ). CiteScore and quartiles reflect the latest available Scopus release. Always verify a journal's current status on its official source before submitting.