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    Electronic Device Failure Analysis

    Electronic Device Failure Analysis is Scopus-indexed (Q4, CiteScore 0.4). Published by ASM International.

    Checked against the index lists dated 4 October 2026.

    ISSN 1537-0755Verify ISSN ↗

    Publisher: ASM International

    Scopus · Q4
    0.4
    CiteScore 2025
    Scopus
    Q4
    Best quartile
    rank 229 of 282 · 18th pctile
    1
    Indexed in
    major index

    Cost to publish: No APC data — check the publisher

    ScopusElsevier Scopus
    Status
    Active
    Coverage
    2004–present
    Source type
    Journal
    Open access
    No
    CiteScore
    0.4
    SJR · SCImago
    0.112
    Q4 SJR quartile
    H-index
    7
    Best quartile
    Q4 · 18th pctile
    Subject areaRankPctileQ
    Safety, Risk, Reliability and Quality229 / 28218thQ4
    Electrical and Electronic Engineering914 / 103011thQ4
    View this source on Scopus.com
    DOAJDirectory of Open Access Journals (live)
    Not in DOAJ
    Open accessNot registered as fully open access

    Not listed in: Web of Science, DOAJ, ABDC, ABS / AJG, FT50, UT Dallas, ONOS (subscription), ONOS (APC covered)

    Quick answers

    Is Electronic Device Failure Analysis indexed in Scopus?

    Yes — actively indexed in Scopus, coverage 2004–present, best quartile Q4, CiteScore 0.4.

    What quartile is Electronic Device Failure Analysis in Scopus?

    Electronic Device Failure Analysis is Q4 in Safety, Risk, Reliability and Quality (rank 229 of 282) and Q4 in Electrical and Electronic Engineering (rank 914 of 1030), by CiteScore 2025.

    What is the impact factor of Electronic Device Failure Analysis?

    Electronic Device Failure Analysis is not in the Web of Science Core Collection (SCIE, SSCI, AHCI or ESCI), so Clarivate publishes no Journal Impact Factor for it. Its Scopus CiteScore is 0.4, quartile Q4, 18th percentile. Any "impact factor" quoted elsewhere is not the Clarivate metric. Its SCImago Journal Rank (SJR, a free Scopus-based metric) is 0.112, quartile Q4, with an H-index of 7.

    Who publishes Electronic Device Failure Analysis and what is its ISSN?

    Electronic Device Failure Analysis is published by ASM International. Its ISSN is 1537-0755.

    Is Electronic Device Failure Analysis in Web of Science?

    No — it is not currently in the Web of Science core collections (SCIE, SSCI, AHCI or ESCI).

    Is Electronic Device Failure Analysis open access?

    No — it is not registered as an open-access journal in DOAJ or Scopus.

    How well cited is Electronic Device Failure Analysis? — open metrics via OpenAlex

    Electronic Device Failure Analysis has an h-index of 8 and a 2-year mean of 0.2 citations per paper (OpenAlex). Its Scopus CiteScore is 0.4, quartile Q4. On 2-year citations it ranks #173 of 199 Scopus journals in Safety, Risk, Reliability and Quality.

    8
    h-index
    0.2
    2-yr mean citations
    6
    i10-index
    501
    works indexed
    396
    total citations
    2-yr mean citations, among Scopus journals in the same subject
    #173 of 199 Bottom 14% Safety, Risk, Reliability and Quality
    #651 of 744 Bottom 13% Electrical and Electronic Engineering
    Papers published per year
    025502017: 18 papers1820172018: 21 papers2120182019: 20 papers2020192020: 19 papers1920202021: 22 papers2220212022: 20 papers2020222023: 19 papers1920232024: 19 papers1920242025: 21 papers2120252026: 15 papers so far152026*

    Electronic Device Failure Analysis published 21 papers in 2025; its busiest recent year was 2021 with 22. 2026* is the year so far.

    Main topics
    Integrated Circuits and Semiconductor Failure AnalysisVLSI and Analog Circuit TestingElectron and X-Ray Spectroscopy TechniquesSemiconductor materials and devices

    h-index, i10-index and 2-year mean citedness are open, licence-clear metrics from OpenAlex — not a proprietary impact factor. The subject rank counts only journals that OpenAlex has a figure for; it is not a Scopus or Clarivate ranking. Updated 2026-10-14.

    Who publishes in Electronic Device Failure Analysis? — latest 73 articles, 2021–2026

    In its latest 73 research articles (2021–2026), authors are most often from United States (57.5%), Germany (15.5%) and France (6.2%). More than half of recent authorship comes from one country.

    Author countriesUnited StatesUnited States57.5%GermanyGermany15.5%FranceFrance6.2%BelgiumBelgium4.1%SingaporeSingapore3.2%IrelandIreland2.7% Most frequent institutions (papers)National Institute of Standards and TechnologyNational Institute of Standards…8University of FloridaUniversity of Florida5IMECIMEC4Sandia National LaboratoriesSandia National Laboratories4Intel (United States)Intel (United States)3

    Countries are counted fractionally, so a paper by authors from two countries counts half to each.

    Are there integrity warnings for Electronic Device Failure Analysis? — indicators, not proof of misconduct

    Scopus status: Active. No retracted papers are recorded. The Problematic Paper Screener flags none of its papers. These are indicators to check, not findings against the journal.

    • Scopus statusActive
    • Retracted papers None recorded
    • Problematic Paper Screener flags None flagged
    • Author concentration57.5% of recent authorship from United States

    Retractions from OpenAlex; flags from the Problematic Paper Screener (Cabanac, Labbé & Magazinov, CC BY), 2026-09-21 export. A flag marks a paper for a closer look; it is not a finding against the journal.

    Official sources & links

    Journal website ↗ Scopus source ↗ ISSN Portal · 1537-0755 ↗

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