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IEEE Transactions on Device and Materials Reliability

ISSN 1530-4388 · 1558-2574

Publisher: Institute of Electrical and Electronics Engineers Inc.

Scopus · Q2WoS · SCIEONOS

Is IEEE Transactions on Device and Materials Reliability indexed in Scopus? Yes — actively indexed in Scopus, coverage 2001–2026, best quartile Q2, CiteScore 4.6.

Is IEEE Transactions on Device and Materials Reliability in Web of Science? Yes — indexed in the Science Citation Index Expanded.

Is IEEE Transactions on Device and Materials Reliability open access? No — it is not registered as an open-access journal in DOAJ or Scopus.

4.6
CiteScore 2025
Scopus
Q2
Best quartile
70th percentile
2
Indexed in
major indexes
ABDCAustralian Business Deans Council 2025
Not listed in ABDC.
DOAJDirectory of Open Access Journals (live)
Checking DOAJ…
FT50Financial Times research list
Not listed in FT50.
UT DallasUTD top-100 business research
Not listed in UT Dallas.
ONOS · SubscriptionOne Nation One Subscription — full-text access
This journal is part of the ONOS national subscription — readers at an ONOS-subscribed Indian institution get full-text access to its articles at no cost.
Access depends on your institution’s ONOS participation; the subscribed title list is subject to revision.
Learn about ONOS
ONOS · APC coveredOne Nation One Subscription (Govt of India)
Not in the ONOS APC-supported list.
Publishing in this journal is not centrally APC-funded under One Nation One Subscription.

Official sources & links

Journal website ↗ Scopus source ↗ Web of Science ↗

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Index data is curated from public sources (Scopus, Web of Science, ABDC, FT50, UT Dallas, DOAJ). CiteScore and quartiles reflect the latest available Scopus release. Always verify a journal's current status on its official source before submitting.