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IEEE Transactions on Device and Materials Reliability is Scopus-indexed (Q2, CiteScore 4.6), WoS SCIE. It is covered by India's One Nation One Subscription scheme for reading access. Published by Institute of Electrical and Electronics Engineers Inc..
Checked against the index lists dated .
ISSN 1530-4388Verify ISSN ↗1558-2574Verify ISSN ↗
Publisher: Institute of Electrical and Electronics Engineers Inc.
Cost to publish: About US$2,645 to publish open access (publisher list price, via OpenAlex) — subscription publishing may be free
| Subject area | Rank | Pctile | Q |
|---|---|---|---|
| Safety, Risk, Reliability and Quality | 83 / 282 | 70th | Q2 |
| Electrical and Electronic Engineering | 354 / 1030 | 65th | Q2 |
| Electronic, Optical and Magnetic Materials | 139 / 318 | 56th | Q2 |
Not listed in: DOAJ, ABDC, ABS / AJG, FT50, UT Dallas, ONOS (APC covered)
Yes — actively indexed in Scopus, coverage 2001–present, best quartile Q2, CiteScore 4.6.
IEEE Transactions on Device and Materials Reliability is Q2 in Safety, Risk, Reliability and Quality (rank 83 of 282), Q2 in Electrical and Electronic Engineering (rank 354 of 1030) and Q2 in Electronic, Optical and Magnetic Materials (rank 139 of 318), by CiteScore 2025.
IEEE Transactions on Device and Materials Reliability is indexed in the Science Citation Index Expanded, so it may have a Journal Impact Factor in Clarivate's Journal Citation Reports. JCR is paid, so check it for the current value. The closest free measure is its Scopus CiteScore 4.6, which places it in quartile Q2 at the 70th percentile of its subject. Its SCImago Journal Rank (SJR, a free Scopus-based metric) is 0.451, quartile Q2, with an H-index of 85.
The publisher lists an article processing charge of about US$2,645 for open access (source: OpenAlex). Many journals also publish by the subscription route at no cost to the author, so confirm on the journal's own website.
IEEE Transactions on Device and Materials Reliability is published by Institute of Electrical and Electronics Engineers Inc. Its print ISSN is 1530-4388 and its online ISSN is 1558-2574.
Yes. It is part of the One Nation One Subscription (ONOS) national subscription, so readers at participating Indian institutions get its full text. ONOS does not cover its article processing charge.
Yes — indexed in the Science Citation Index Expanded.
No — it is not registered as an open-access journal in DOAJ or Scopus.
IEEE Transactions on Device and Materials Reliability has an h-index of 89 and a 2-year mean of 2.17 citations per paper (OpenAlex). Its Scopus CiteScore is 4.6, quartile Q2. On 2-year citations it ranks #80 of 199 Scopus journals in Safety, Risk, Reliability and Quality.
IEEE Transactions on Device and Materials Reliability published 151 papers in 2025. 2026* is the year so far.
h-index, i10-index and 2-year mean citedness are open, licence-clear metrics from OpenAlex — not a proprietary impact factor. The subject rank counts only journals that OpenAlex has a figure for; it is not a Scopus or Clarivate ranking. Updated 2026-10-14.
In its latest 97 research articles (2026), authors are most often from China (43.3%), India (17.5%) and United States (6.7%).
Countries are counted fractionally, so a paper by authors from two countries counts half to each.
Scopus status: Active. No retracted papers are recorded. The Problematic Paper Screener flags none of its papers. These are indicators to check, not findings against the journal.
Retractions from OpenAlex; flags from the Problematic Paper Screener (Cabanac, Labbé & Magazinov, CC BY), 2026-09-21 export. A flag marks a paper for a closer look; it is not a finding against the journal.
Index data is curated from public sources (Scopus, Web of Science, ABDC, FT50, UT Dallas, DOAJ). CiteScore and quartiles reflect the latest available Scopus release. Always verify a journal's current status on its official source before submitting.
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