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Microelectronics Reliability
Microelectronics Reliability is Scopus-indexed (Q2, CiteScore 4.5), WoS SCIE. It is covered by India's One Nation One Subscription scheme for reading access. Published by Elsevier Ltd.
ONOS · SubscriptionOne Nation One Subscription — full-text access
This journal is part of the ONOS national subscription — readers at an ONOS-subscribed Indian institution get full-text access to its articles at no cost.
Access depends on your institution’s ONOS participation; the subscribed title list is subject to revision.
Not listed in:DOAJ, ABDC, ABS / AJG, FT50, UT Dallas, ONOS (APC covered)
Quick answers
Is Microelectronics Reliability indexed in Scopus?
Yes — actively indexed in Scopus, coverage 1962–present, best quartile Q2, CiteScore 4.5.
What quartile is Microelectronics Reliability in Scopus?
Microelectronics Reliability is Q2 in Safety, Risk, Reliability and Quality (rank 86 of 282), Q2 in Electrical and Electronic Engineering (rank 359 of 1030) and Q2 in Condensed Matter Physics (rank 185 of 446), by CiteScore 2025. It is ranked in 6 subject areas in all.
What is the impact factor of Microelectronics Reliability?
Microelectronics Reliability is indexed in the Science Citation Index Expanded, so it may have a Journal Impact Factor in Clarivate's Journal Citation Reports. JCR is paid, so check it for the current value. The closest free measure is its Scopus CiteScore 4.5, which places it in quartile Q2 at the 69th percentile of its subject. Its SCImago Journal Rank (SJR, a free Scopus-based metric) is 0.464, quartile Q2, with an H-index of 115.
How much does it cost to publish in Microelectronics Reliability?
The publisher lists an article processing charge of about US$2,280 for open access (source: OpenAlex). Many journals also publish by the subscription route at no cost to the author, so confirm on the journal's own website.
Who publishes Microelectronics Reliability and what is its ISSN?
Microelectronics Reliability is published by Elsevier Ltd. Its print ISSN is 0026-2714 and its online ISSN is 1872-941X.
Is Microelectronics Reliability covered under ONOS in India?
Yes. It is part of the One Nation One Subscription (ONOS) national subscription, so readers at participating Indian institutions get its full text. ONOS does not cover its article processing charge.
Is Microelectronics Reliability in Web of Science?
Yes — indexed in the Science Citation Index Expanded.
Is Microelectronics Reliability open access?
No — it is not registered as an open-access journal in DOAJ or Scopus.
How well cited is Microelectronics Reliability? — open metrics via OpenAlex
Microelectronics Reliability has an h-index of 133 and a 2-year mean of 2.64 citations per paper (OpenAlex). Its Scopus CiteScore is 4.5, quartile Q2. On 2-year citations it ranks #67 of 199 Scopus journals in Safety, Risk, Reliability and Quality.
133
h-index
2.64
2-yr mean citations
5,147
i10-index
31,096
works indexed
206,172
total citations
Publication fee · open access list price, US$
US$2,280
05001,0002,0003,000+
2-yr mean citations, among Scopus journals in the same subject
#67 of 199Top 34%Safety, Risk, Reliability and Quality
#281 of 744Top 38%Electrical and Electronic Engineering
#177 of 425Top 42%Condensed Matter Physics
Papers published per year
Microelectronics Reliability published 320 papers in 2025; its busiest recent year was 2017 with 514. 2026* is the year so far.
Main topics
Semiconductor materials and devicesIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Semiconductor Devices and Circuit DesignElectronic Packaging and Soldering Technologies
h-index, i10-index and 2-year mean citedness are open, licence-clear metrics from OpenAlex — not a proprietary impact factor. The subject rank counts only journals that OpenAlex has a figure for; it is not a Scopus or Clarivate ranking. Updated 2026-10-14.
Who publishes in Microelectronics Reliability? — latest 97 articles, 2026
In its latest 97 research articles (2026), authors are most often from China (54.6%), India (13.7%) and South Korea (7.7%). More than half of recent authorship comes from one country.
Countries are counted fractionally, so a paper by authors from two countries counts half to each.
Are there integrity warnings for Microelectronics Reliability? — indicators, not proof of misconduct
Scopus status: Active. 4 retracted papers are recorded (0.1 per 1,000 papers). The Problematic Paper Screener flags none of its papers. These are indicators to check, not findings against the journal.
Scopus statusActive
Retracted papers4 · 0.1 per 1,000 papers
Problematic Paper Screener flagsNone flagged
Author concentration54.6% of recent authorship from China
Retractions from OpenAlex; flags from the Problematic Paper Screener (Cabanac, Labbé & Magazinov, CC BY), 2026-09-21 export. A flag marks a paper for a closer look; it is not a finding against the journal.
Index data is curated from public sources (Scopus, Web of Science, ABDC, FT50, UT Dallas, DOAJ). CiteScore and quartiles reflect the latest available Scopus release. Always verify a journal's current status on its official source before submitting.
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