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Surface Topography: Metrology and Properties is Scopus-indexed (Q2, CiteScore 4.4), WoS SCIE. It is covered by India's One Nation One Subscription scheme for reading access. Published by IOP Publishing Ltd..
Checked against the index lists dated .
ISSN 2051-672XVerify ISSN ↗
Publisher: IOP Publishing Ltd.
Cost to publish: About US$3,325 to publish open access (publisher list price, via OpenAlex) — subscription publishing may be free
| Subject area | Rank | Pctile | Q |
|---|---|---|---|
| Instrumentation | 58 / 206 | 72nd | Q2 |
| Surfaces, Coatings and Films | 60 / 141 | 57th | Q2 |
| Materials Chemistry | 161 / 327 | 50th | Q2 |
| Process Chemistry and Technology | 47 / 84 | 44th | Q3 |
Not listed in: DOAJ, ABDC, ABS / AJG, FT50, UT Dallas, ONOS (APC covered)
Yes — actively indexed in Scopus, coverage 2013–present, best quartile Q2, CiteScore 4.4.
Surface Topography: Metrology and Properties is Q2 in Instrumentation (rank 58 of 206), Q2 in Surfaces, Coatings and Films (rank 60 of 141) and Q2 in Materials Chemistry (rank 161 of 327), by CiteScore 2025. It is ranked in 4 subject areas in all.
Surface Topography: Metrology and Properties is indexed in the Science Citation Index Expanded, so it may have a Journal Impact Factor in Clarivate's Journal Citation Reports. JCR is paid, so check it for the current value. The closest free measure is its Scopus CiteScore 4.4, which places it in quartile Q2 at the 72nd percentile of its subject. Its SCImago Journal Rank (SJR, a free Scopus-based metric) is 0.363, quartile Q3, with an H-index of 43.
The publisher lists an article processing charge of about US$3,325 for open access (source: OpenAlex). Many journals also publish by the subscription route at no cost to the author, so confirm on the journal's own website.
Surface Topography: Metrology and Properties is published by IOP Publishing Ltd. Its ISSN is 2051-672X.
Yes. It is part of the One Nation One Subscription (ONOS) national subscription, so readers at participating Indian institutions get its full text. ONOS does not cover its article processing charge.
Yes — indexed in the Science Citation Index Expanded.
No — it is not registered as an open-access journal in DOAJ or Scopus.
Surface Topography: Metrology and Properties has an h-index of 46 and a 2-year mean of 1.83 citations per paper (OpenAlex). Its Scopus CiteScore is 4.4, quartile Q2. On 2-year citations it ranks #73 of 146 Scopus journals in Instrumentation.
Surface Topography: Metrology and Properties published 125 papers in 2025; its busiest recent year was 2021 with 209. 2026* is the year so far.
h-index, i10-index and 2-year mean citedness are open, licence-clear metrics from OpenAlex — not a proprietary impact factor. The subject rank counts only journals that OpenAlex has a figure for; it is not a Scopus or Clarivate ranking. Updated 2026-10-14.
In its latest 98 research articles (2025–2026), authors are most often from China (61.2%), Türkiye (4.6%) and India (4.6%). More than half of recent authorship comes from one country.
Countries are counted fractionally, so a paper by authors from two countries counts half to each.
Scopus status: Active. 2 retracted papers are recorded (1.5 per 1,000 papers). The Problematic Paper Screener flags 1 of its papers. These are indicators to check, not findings against the journal.
Retractions from OpenAlex; flags from the Problematic Paper Screener (Cabanac, Labbé & Magazinov, CC BY), 2026-09-21 export. A flag marks a paper for a closer look; it is not a finding against the journal.
Index data is curated from public sources (Scopus, Web of Science, ABDC, FT50, UT Dallas, DOAJ). CiteScore and quartiles reflect the latest available Scopus release. Always verify a journal's current status on its official source before submitting.
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