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IEEE Design and Test is Scopus-indexed (Q2, CiteScore 4.2), WoS SCIE. It is covered by India's One Nation One Subscription scheme for reading access. Published by IEEE Computer Society.
Checked against the index lists dated .
ISSN 2168-2356Verify ISSN ↗2168-2364Verify ISSN ↗
Publisher: IEEE Computer Society
Cost to publish: No APC data — check the publisher
| Subject area | Rank | Pctile | Q |
|---|---|---|---|
| Electrical and Electronic Engineering | 378 / 1030 | 63rd | Q2 |
| Hardware and Architecture | 100 / 245 | 59th | Q2 |
| Software | 225 / 503 | 55th | Q2 |
Not listed in: DOAJ, ABDC, ABS / AJG, FT50, UT Dallas, ONOS (APC covered)
Yes — actively indexed in Scopus, coverage 2013–present, best quartile Q2, CiteScore 4.2.
IEEE Design and Test is Q2 in Electrical and Electronic Engineering (rank 378 of 1030), Q2 in Hardware and Architecture (rank 100 of 245) and Q2 in Software (rank 225 of 503), by CiteScore 2025.
IEEE Design and Test is indexed in the Science Citation Index Expanded, so it may have a Journal Impact Factor in Clarivate's Journal Citation Reports. JCR is paid, so check it for the current value. The closest free measure is its Scopus CiteScore 4.2, which places it in quartile Q2 at the 63rd percentile of its subject. Its SCImago Journal Rank (SJR, a free Scopus-based metric) is 0.471, quartile Q2, with an H-index of 89.
IEEE Design and Test is published by IEEE Computer Society. Its print ISSN is 2168-2356 and its online ISSN is 2168-2364.
Yes. It is part of the One Nation One Subscription (ONOS) national subscription, so readers at participating Indian institutions get its full text. ONOS does not cover its article processing charge.
Yes — indexed in the Science Citation Index Expanded.
No — it is not registered as an open-access journal in DOAJ or Scopus.
IEEE Design and Test has an h-index of 47 and a 2-year mean of 1.06 citations per paper (OpenAlex). Its Scopus CiteScore is 4.2, quartile Q2. On 2-year citations it ranks #489 of 744 Scopus journals in Electrical and Electronic Engineering.
IEEE Design and Test published 110 papers in 2025; its busiest recent year was 2017 with 152. 2026* is the year so far.
h-index, i10-index and 2-year mean citedness are open, licence-clear metrics from OpenAlex — not a proprietary impact factor. The subject rank counts only journals that OpenAlex has a figure for; it is not a Scopus or Clarivate ranking. Updated 2026-10-14.
In its latest 62 research articles (2025–2026), authors are most often from United States (45.2%), Brazil (15.3%) and India (4%).
Countries are counted fractionally, so a paper by authors from two countries counts half to each.
Scopus status: Active. No retracted papers are recorded. The Problematic Paper Screener flags none of its papers. These are indicators to check, not findings against the journal.
Retractions from OpenAlex; flags from the Problematic Paper Screener (Cabanac, Labbé & Magazinov, CC BY), 2026-09-21 export. A flag marks a paper for a closer look; it is not a finding against the journal.
Index data is curated from public sources (Scopus, Web of Science, ABDC, FT50, UT Dallas, DOAJ). CiteScore and quartiles reflect the latest available Scopus release. Always verify a journal's current status on its official source before submitting.
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