Back
Share

IEEE Design and Test of Computers

IEEE Design and Test of Computers is not currently indexed in Scopus. Published by IEEE Computer Society.

ISSN 0740-7475Verify ISSN ↗1558-1918Verify ISSN ↗

Publisher: IEEE Computer Society

Scopus · Inactive
0
Indexed in
major indexes

Cost to publish: No APC data — check the publisher

Web of ScienceClarivate (SCIE/SSCI/AHCI/ESCI)
Not listed in Web of Science.
ABDCAustralian Business Deans Council 2025
Not listed in ABDC.
DOAJDirectory of Open Access Journals (live)
Not in DOAJ
Open accessNot registered as fully open access
FT50Financial Times research list
Not listed in FT50.
UT DallasUTD top-100 business research
Not listed in UT Dallas.
ONOS · APC coveredOne Nation One Subscription (Govt of India)
Not in the ONOS APC-supported list.
Publishing in this journal is not centrally APC-funded under One Nation One Subscription.

Is IEEE Design and Test of Computers indexed in Scopus? No — it was previously covered by Scopus but its coverage is now inactive/discontinued (1984–2012).

What is the impact factor of IEEE Design and Test of Computers? IEEE Design and Test of Computers has no Journal Impact Factor — JIF is published only for Web of Science SCIE and SSCI titles — and Scopus has not published a current CiteScore for it either. Treat any "impact factor" quoted for this journal elsewhere as unofficial.

Is IEEE Design and Test of Computers in Web of Science? No — it is not currently in the Web of Science core collections (SCIE, SSCI, AHCI or ESCI).

Is IEEE Design and Test of Computers open access? No — it is not registered as an open-access journal in DOAJ or Scopus.

Impact & reach — open metrics via OpenAlex

111
h-index
0
2-yr mean citations
797
i10-index
3,030
works indexed
54,275
total citations
Papers published per year
01002002011: 138 papers13820112012: 160 papers16020122013: 1 papers120132015: 4 papers420152016: 9 papers920162017: 7 papers720172018: 1 papers120182019: 1 papers120192020: 3 papers320202023: 1 papers12023Scopus coverage ends 2012

IEEE Design and Test of Computers published 1 papers in 2023; its busiest recent year was 2012 with 160. 2026* is the year so far.

Main topics
VLSI and Analog Circuit TestingDiverse Scientific and Economic StudiesIntegrated Circuits and Semiconductor Failure AnalysisHuman auditory perception and evaluation

h-index, i10-index and 2-year mean citedness are open, licence-clear metrics from OpenAlex — not a proprietary impact factor. Updated 2026-09-24.

Integrity signals — indicators, not proof of misconduct

  • Scopus statusInactive — coverage ended 2012
  • Retracted papers None recorded

Retractions and authorship from OpenAlex; Scopus status from the Scopus source list. A signal marks something to look at more closely; it is not a finding against the journal.

Official sources & links

Scopus source ↗ ISSN Portal · 0740-7475 ↗ISSN Portal · 1558-1918 ↗

Related journals

← Back to Journal Finder

Index data is curated from public sources (Scopus, Web of Science, ABDC, FT50, UT Dallas, DOAJ). CiteScore and quartiles reflect the latest available Scopus release. Always verify a journal's current status on its official source before submitting.